Takashi Mochiyama

According to our database, Takashi Mochiyama authored at least 2 papers between 2003 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2004

Detection of multiple transitions in delay fault test of SPARC64 microprocessor.

Daisuke Maruyama, Akira Kanuma, Takashi Mochiyama, Hiroaki Komatsu, Yaroku Sugiyama, Noriyuki Ito

Proceedings of the 2004 International Conference on Computer-Aided Design, 2004

2003

BIST-Aided Scan Test - A New Method for Test Cost Reduction.

Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003