Korbinian Reiser
According to our database1,
Korbinian Reiser
authored at least 2 papers
between 2023 and 2025.
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Bibliography
2025
Evidence for 2D Hole Gas in GaN Gate Injection Transistors and its Role in RDson Recovery.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2023
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests.
Proceedings of the IEEE International Reliability Physics Symposium, 2023