According to our database1, Clemens Ostermaier authored at least 4 papers between 2012 and 2018.
Legend:Book In proceedings Article PhD thesis Other
Review of bias-temperature instabilities at the III-N/dielectric interface.
Microelectronics Reliability, 2018
Thermal activation of PBTI-related stress and recovery processes in GaN MIS-HEMTs using on-wafer heaters.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
On the fly characterization of charge trapping phenomena at GaN/dielectric and GaN/AlGaN/dielectric interfaces using impedance measurements.
Proceedings of the 45th European Solid State Device Research Conference, 2015
Reliability investigation of the degradation of the surface passivation of InAlN/GaN HEMTs using a dual gate structure.
Microelectronics Reliability, 2012