Andrea Minetto

According to our database1, Andrea Minetto authored at least 6 papers between 2019 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2023
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Modeling Hot-Electron Trapping in GaN-based HEMTs.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021
A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level.
Proceedings of the IEEE International Reliability Physics Symposium, 2021

Charge Trapping in GaN Power Transistors: Challenges and Perspectives.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021

2020
System-level evaluation of dynamic effects in a GaN-based class-E power amplifier.
Integr., 2020

2019
System-Level Assessment of Dynamic Effects in GaN-based Power Converters.
Proceedings of the 15th Conference on Ph.D. Research in Microelectronics and Electronics, 2019


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