Takashi Ishida

Affiliations:
  • ROHM Semiconductor, Yokohama, Japan


According to our database1, Takashi Ishida authored at least 17 papers between 2019 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2023
Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing.
IEICE Electron. Express, 2023

Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion.
Proceedings of the IEEE International Test Conference, 2023

A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation.
Proceedings of the IEEE International Test Conference in Asia, 2023

2022
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies.
J. Electron. Test., 2022


High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST.
Proceedings of the IEEE 31st Asian Test Symposium, 2022

2021
Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies.
Proceedings of the IEEE International Test Conference, 2021

Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer.
Proceedings of the IEEE International Test Conference, 2021

Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method.
Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production.
Proceedings of the 28th IEEE International Conference on Electronics, 2021

High Precision Measurement of Sub-Nano Ampere Current in ATE Environment.
Proceedings of the 30th IEEE Asian Test Symposium, 2021

2020
Accurate Testing of Precision Voltage Reference by DC-AC Conversion.
Proceedings of the 29th IEEE Asian Test Symposium, 2020

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers.
Proceedings of the 29th IEEE Asian Test Symposium, 2020

2019

Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion.
Proceedings of the IEEE International Test Conference in Asia, 2019

High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm.
Proceedings of the 13th IEEE International Conference on ASIC, 2019

Evaluation of Null Method for Operational Amplifier Short-Time Testing.
Proceedings of the 13th IEEE International Conference on ASIC, 2019


  Loading...