Laurent Artola

Orcid: 0000-0003-0730-7518

According to our database1, Laurent Artola authored at least 7 papers between 2014 and 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

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Bibliography

2019
Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs.
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019

Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility.
Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019

2018
Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature.
Sensors, 2018

Impact of different transistor arrangements on gate variability.
Microelectron. Reliab., 2018

2017
Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology.
Microelectron. Reliab., 2017

2015
Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFET technologies due to atmospheric radiation.
Integr., 2015

2014
Comparative soft error evaluation of layout cells in FinFET technology.
Microelectron. Reliab., 2014


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