Ygor Aguiar

According to our database, Ygor Aguiar authored at least 10 papers between 2016 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Effect of Temperature on Single Event Latchup Sensitivity.

S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

2018

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions.

Ygor Q. Aguiar, Frederic Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget

Microelectron. Reliab., 2018

2017

Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition.

Walter E. Calienes Bartra, Y. Q. de Aguiar, Cristina Meinhardt, Andrei Vladimirescu, Ricardo Augusto da Luz Reis

Microelectron. Reliab., 2017

Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology.

Y. Q. de Aguiar, Laurent Artola, Guillaume Hubert, Cristina Meinhardt, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis

Microelectron. Reliab., 2017

Radiation sensitivity of XOR topologies in multigate technologies under voltage variability.

Ygor Q. de Aguiar, Cristina Meinhardt, Ricardo A. L. Reis

Proceedings of the 8th IEEE Latin American Symposium on Circuits & Systems, 2017

Robustness of Sub-22nm multigate devices against physical variability.

Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices.

Ygor Q. Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis

Proceedings of the 24th IEEE International Conference on Electronics, Circuits and Systems, 2017

SET response of FinFET-based majority voter circuits under work-function fluctuation.

Y. Q. de Aguiar, Fernanda Lima Kastensmidt, Cristina Meinhardt, Ricardo A. L. Reis

Proceedings of the 24th IEEE International Conference on Electronics, Circuits and Systems, 2017

2016

Permanent and single event transient faults reliability evaluation EDA tool.

Y. Q. de Aguiar, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis

Microelectron. Reliab., 2016

Geometric variability impact on 7nm Trigate combinational cells.

Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis

Proceedings of the 2016 IEEE International Conference on Electronics, Circuits and Systems, 2016