Libor Rufer

Orcid: 0000-0002-1226-2994

According to our database1, Libor Rufer authored at least 18 papers between 2003 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

Online presence:

On csauthors.net:

Bibliography

2023
Cell Alignment in Aqueous Solution Employing a Flexural Plate Wave Piezoelectric MEMS Transducer.
IEEE Access, 2023

2020
Performances Evaluation of On-Chip Large-Size-Tapped Transformer for MEMS Applications.
IEEE Trans. Instrum. Meas., 2020

2019
Air-coupled Ultrasonic Rangefinder with Meter-long Detection Range Based on a Dual-electrode PMUT Fabricated Using a Multi-user MEMS Process.
Proceedings of the 2019 IEEE SENSORS, Montreal, QC, Canada, October 27-30, 2019, 2019

2013
CMOS-MEMS technology with front-end surface etching of sacrificial SiO2 dedicated for acoustic devices.
Proceedings of the 5th IEEE International Workshop on Advances in Sensors and Interfaces, 2013

2011
Wide-band piezoresistive aero-acoustic microphone.
Proceedings of the IEEE/IFIP 19th International Conference on VLSI and System-on-Chip, 2011

2010
Design of a SAW-based chemical sensor with its microelectronics front-end interface.
Microelectron. J., 2010

Low Frequency Test for RF MEMS Switches.
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

2009
Pseudorandom BIST for test and characterization of linear and nonlinear MEMS.
Microelectron. J., 2009

2008
Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing.
VLSI Design, 2008

2006
Built-in-self-test techniques for MEMS.
Microelectron. J., 2006

Pseudorandom functional BIST for linear and nonlinear MEMS.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006

2005
On-Chip Pseudorandom MEMS Testing.
J. Electron. Test., 2005

On-chip Pseudorandom Testing for Linear and Nonlinear MEMS.
Proceedings of the VLSI-SoC: From Systems To Silicon, 2005

Evaluation of impulse response-based BIST techniques for MEMS in the presence of weak nonlinearities.
Proceedings of the 10th European Test Symposium, 2005

2004
On-chip testing of embedded transducers.
Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

On-chip testing of embedded silicon transducers.
Proceedings of the Proceedings 2004 IEEE International SOC Conference, 2004

Mems built-in-self-test using MLS.
Proceedings of the 9th European Test Symposium, 2004

2003
An implementation of memory-based on-chip analogue test signal generation.
Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003


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