Luis Elvira Villagra

According to our database, Luis Elvira Villagra authored at least 3 papers between 2006 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits.

Josep Rius, Luis Elvira Villagra, Maurice Meijer

Proceedings of the 14th IEEE European Test Symposium, 2009

2007

Modeling Power Supply Noise in Delay Testing.

Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger

IEEE Des. Test Comput., 2007

2006

Power Supply Noise in Delay Testing.

Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger

Proceedings of the 2006 IEEE International Test Conference, 2006