M. Amine Salhi

According to our database, M. Amine Salhi authored at least 8 papers between 2003 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

Joule expansion imaging techniques on microlectronic devices.

Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire

Microelectron. J., 2009

2008

Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues.

Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire

Microelectron. Reliab., 2008

Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers.

Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire

Proceedings of the 13th European Test Symposium, 2008

2006

Time gating imaging through thick silicon substrate: a new step towards backside characterisation.

Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire

Microelectron. Reliab., 2006

2005

ElectroStatic Discharge Fault Localization by Laser Probing.

Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire

Microelectron. Reliab., 2005

2004

Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope.

Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz

Microelectron. J., 2004

Sensing temperature in CMOS circuits for Thermal Testing.

Josep Altet, Antonio Rubio, M. Amine Salhi, Jose Luis Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

2003

Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.

Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys

Microelectron. Reliab., 2003