Stéphane Grauby

According to our database, Stéphane Grauby authored at least 14 papers between 2001 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment.

Jérémy Michaud, G. Pedroza, Laurent Béchou, L. S. How, Olivier Gilard, David Veyrié, F. Laruelle, Stéphane Grauby

Microelectron. Reliab., 2015

2014

Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.

Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà

Microelectron. J., 2014

2009

Joule expansion imaging techniques on microlectronic devices.

Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire

Microelectron. J., 2009

2008

Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues.

Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire

Microelectron. Reliab., 2008

Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers.

Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire

Proceedings of the 13th European Test Symposium, 2008

2006

Time gating imaging through thick silicon substrate: a new step towards backside characterisation.

Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire

Microelectron. Reliab., 2006

2005

ElectroStatic Discharge Fault Localization by Laser Probing.

Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire

Microelectron. Reliab., 2005

2004

Strain energy imaging of a power MOS transistor using speckle interferometry.

Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Wilfrid Claeys

IEEE Trans. Reliab., 2004

Applications of temperature phase measurements to IC testing.

Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby

Microelectron. Reliab., 2004

Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope.

Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz

Microelectron. J., 2004

Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy.

Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale

Microelectron. J., 2004

2003

Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.

Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys

Microelectron. Reliab., 2003

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.

G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys

Microelectron. Reliab., 2003

2001

Laser diode COFD analysis by thermoreflectance microscopy.

Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patiño Lopez, Emmanuel Schaub, Wilfrid Claeys

Microelectron. Reliab., 2001