Josep Altet
Orcid: 0000-0002-6939-6475
According to our database1,
Josep Altet
authored at least 38 papers
between 1997 and 2023.
Collaborative distances:
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Bibliography
2023
IEEE Trans. Very Large Scale Integr. Syst., November, 2023
Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements.
Sensors, August, 2023
J. Syst. Archit., 2023
2022
Two examples of approximate arithmetic to reduce hardware complexity and power consumption.
Proceedings of the 37th Conference on Design of Circuits and Integrated Systems, 2022
2021
2019
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging.
IEEE Trans. Instrum. Meas., 2019
Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology.
Sensors, 2019
Proceedings of the XXXIV Conference on Design of Circuits and Integrated Systems, 2019
Proceedings of the XXXIV Conference on Design of Circuits and Integrated Systems, 2019
2015
IEEE Trans. Instrum. Meas., 2015
2014
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.
Microelectron. J., 2014
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014
2013
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
2012
Microelectron. J., 2012
J. Electron. Test., 2012
Proceedings of the 2012 IEEE International Test Conference, 2012
Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012
Design of a fully integrated CMOS self-testable RF power amplifier using a thermal sensor.
Proceedings of the 38th European Solid-State Circuit conference, 2012
Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012
2011
Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor.
IEEE Trans. Circuits Syst. I Regul. Pap., 2011
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations.
J. Electron. Test., 2011
Monitor strategies for variability reduction considering correlation between power and timing variability.
Proceedings of the IEEE 24th International SoC Conference, SOCC 2011, Taipei, Taiwan, 2011
2010
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits.
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010
2009
Proceedings of the 2009 IEEE International Test Conference, 2009
2008
Proceedings of the 13th European Test Symposium, 2008
2007
Electrical characterization of analogue and RF integrated circuits by thermal measurements.
Microelectron. J., 2007
2006
Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006
2004
Microelectron. Reliab., 2004
Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004
2003
J. Electron. Test., 2003
IEEE Commun. Mag., 2003
2002
2001
IEEE J. Solid State Circuits, 2001
2000
Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000
1999
J. Electron. Test., 1999
1997
Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997
Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997