M. H. Lin

According to our database1, M. H. Lin authored at least 7 papers between 2005 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2023
A Novel Methodology to Predict Process-Induced Warpage in Advanced BEOL Interconnects.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Redundancy Effect on Electromigration Failure Time in Power Grid Networks.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2015
Mechanisms of electromigration under AC and pulsed-DC stress in Cu/low-k dual damascene interconnects.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2008
Effects of length scaling on electromigration in dual-damascene copper interconnects.
Microelectron. Reliab., 2008

2007
Effects of width scaling and layout variation on dual damascene copper interconnect electromigration.
Microelectron. Reliab., 2007

2005
Copper interconnect electromigration behaviors in various structures and lifetime improvement by cap/dielectric interface treatment.
Microelectron. Reliab., 2005

A location-based incentive pricing scheme for tree-based relaying in multi-hop cellular networks.
Proceedings of the Integrated Network Management, 2005


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