M. H. Lin
According to our database1,
M. H. Lin
authored at least 7 papers
between 2005 and 2023.
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Bibliography
2023
A Novel Methodology to Predict Process-Induced Warpage in Advanced BEOL Interconnects.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2015
Mechanisms of electromigration under AC and pulsed-DC stress in Cu/low-k dual damascene interconnects.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
2008
Effects of length scaling on electromigration in dual-damascene copper interconnects.
Microelectron. Reliab., 2008
2007
Effects of width scaling and layout variation on dual damascene copper interconnect electromigration.
Microelectron. Reliab., 2007
2005
Copper interconnect electromigration behaviors in various structures and lifetime improvement by cap/dielectric interface treatment.
Microelectron. Reliab., 2005
A location-based incentive pricing scheme for tree-based relaying in multi-hop cellular networks.
Proceedings of the Integrated Network Management, 2005