Mauro Ciappa
According to our database1,
Mauro Ciappa
authored at least 53 papers
between 2001 and 2021.
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Bibliography
2021
Assessing the pre-breakdown carriers' multiplication in SiC power MOSFETs by soft gamma radiation and its correlation to the Terrestrial Cosmic Rays failure rate data as measured by neutron irradiation.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2020
Measurement of the Pre-Breakdown Characteristics in Silicon Carbide Power Devices by the Use of Radioactive Gamma Sources.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2018
Charge and energy deposition in thick silicon depletion layers by environmental ionizing radiation and terrestrial cosmic rays.
Microelectron. Reliab., 2018
Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources.
Microelectron. Reliab., 2018
2017
Reliability investigation of the copper-zinc system for solid diffusion bonding in power modules.
Microelectron. Reliab., 2017
2016
Electro-thermal simulation of current sharing in silicon and silicon carbide power modules under short circuit condition of types I and II.
Microelectron. Reliab., 2016
Modeling the threshold voltage instability in SiC MOSFETs by multiphonon-assisted tunneling.
Microelectron. Reliab., 2016
2015
TCAD simulation of current filamentation in adjacent IGBT cells under turn-on and turn-off short circuit condition.
Microelectron. Reliab., 2015
Reliability odometer for real-time and in situ lifetime measurement of power devices.
Microelectron. Reliab., 2015
2014
Study of thermal cycling and temperature aging on PbSnAg die attach solder joints for high power modules.
Microelectron. Reliab., 2014
Exploring the limits of scanning electron microscopy for the metrology of critical dimensions of photoresist structures in the nanometer range.
Microelectron. Reliab., 2014
Exact 3D simulation of Scanning Electron Microscopy images of semiconductor devices in the presence of electric and magnetic fields.
Microelectron. Reliab., 2014
Monte Carlo modeling of the extraction of roughness parameters at nanometer scale by Critical Dimension Scanning Electron Microscopy.
Proceedings of the 44th European Solid State Device Research Conference, 2014
2013
A new two-dimensional TCAD model for threshold instability in silicon carbide MOSFETs.
Microelectron. Reliab., 2013
Unstructured tetrahedric meshes for the description of complex three-dimensional sample geometries in Monte Carlo simulation of scanning electron microscopy images for metrology applications.
Microelectron. Reliab., 2013
Avoiding misleading artefacts in metallurgical preparation of die attach solder joints in high power modules.
Microelectron. Reliab., 2013
2012
Electro-thermal simulation in the time domain of GaN HEMT for RF switch-mode amplifier.
Microelectron. Reliab., 2012
Monte Carlo simulation of emission site, angular and energy distributions of secondary electrons in silicon at low beam energies.
Microelectron. Reliab., 2012
2011
Synthesis of scanning electron microscopy images by high performance computing for the metrology of advanced CMOS processes.
Microelectron. Reliab., 2011
Design of optimum electron beam irradiation processes for the reliability of electric cables used in critical applications.
Microelectron. Reliab., 2011
A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment.
J. Electron. Test., 2011
2010
Accurate extraction of the mechanical properties of thin films by nanoindentation for the design of reliable MEMS.
Microelectron. Reliab., 2010
A new built-in screening methodology for Successive Approximation Register Analog to Digital Converters.
Microelectron. Reliab., 2010
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy.
Microelectron. Reliab., 2010
Novel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications.
Proceedings of the 15th European Test Symposium, 2010
2009
A new built-in screening methodology to achieve zero defects in the automotive environment.
Microelectron. Reliab., 2009
Multiscale simulation of aluminum thin films for the design of highly-reliable MEMS devices.
Microelectron. Reliab., 2009
Ensuring the reliability of electron beam crosslinked electric cables by the optimization of the dose depth distribution with Monte Carlo simulation.
Microelectron. Reliab., 2009
Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications.
Proceedings of the 14th IEEE European Test Symposium, 2009
2008
Novel simulation approach for transient analysis and reliable thermal management of power devices.
Microelectron. Reliab., 2008
2007
Microelectron. Reliab., 2007
Virtual reliability assessment of integrated power switches based on multi-domain simulation approach.
Microelectron. Reliab., 2007
A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs.
Microelectron. Reliab., 2007
Measurement of the transient junction temperature in MOSFET devices under operating conditions.
Microelectron. Reliab., 2007
2006
Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications.
Microelectron. Reliab., 2006
Microelectron. Reliab., 2006
New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions.
Microelectron. Reliab., 2006
2005
Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices.
Microelectron. Reliab., 2005
Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles.
Microelectron. Reliab., 2005
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast.
Microelectron. Reliab., 2005
2004
Characterization of self-heating effects in semiconductor resistors during transmission line pulses.
Microelectron. Reliab., 2004
On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy Techniques.
Microelectron. Reliab., 2004
2D Dopant Profiling on 4H Silicon Carbide P<sup>+</sup>N Junction by Scanning Capacitance and Scanning Electron Microscopy.
Microelectron. Reliab., 2004
2003
A New Procedure to Define the Zero-Field Condition and to Delineate pn-Junctions in Silicon Devices by Scanning Capacitance Microscopy.
Microelectron. Reliab., 2003
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices.
Microelectron. Reliab., 2003
2002
Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction.
Microelectron. Reliab., 2002
A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors.
Microelectron. Reliab., 2002
2001
Microelectron. Reliab., 2001