Markus Leicht

According to our database¹, Markus Leicht authored at least 3 papers between 2001 and 2004.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

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PhD thesis

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Bibliography

2004

2D Dopant Profiling on 4H Silicon Carbide P<sup>+</sup>N Junction by Scanning Capacitance and Scanning Electron Microscopy.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2004

2002

Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2002

2001

A reliable course of Scanning Capacitance Microscopy analysis applied for 2D-Dopant Profilings of Power MOSFET Devices.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2001

Markus Leicht

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Bibliography

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