Mariam Momenzadeh

According to our database1, Mariam Momenzadeh authored at least 16 papers between 2003 and 2010.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2010
Emulating shared-memory Do-All algorithms in asynchronous message-passing systems.
J. Parallel Distributed Comput., 2010

2007
Design of sequential circuits by quantum-dot cellular automata.
Microelectron. J., 2007

Analysis of missing and additional cell defects in sequential quantum-dot cellular automata.
Integr., 2007

On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire.
J. Electron. Test., 2007

An Overview of Nanoscale Devices and Circuits.
IEEE Des. Test Comput., 2007

2006
Measuring the timing jitter of ATE in the frequency domain.
IEEE Trans. Instrum. Meas., 2006

Defect tolerance of QCA tiles.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006

2005
Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

Tile-based QCA design using majority-like logic primitives.
ACM J. Emerg. Technol. Comput. Syst., 2005

Modeling QCA Defects at Molecular-level in Combinational Circuits.
Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

Defect Characterization and Tolerance of QCA Sequential Devices and Circuits.
Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

2004
Defects and Faults in Quantum Cellular Automata at Nano Scale.
Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Quantum Cellular Automata: New Defects and Faults for New Devices.
Proceedings of the 18th International Parallel and Distributed Processing Symposium (IPDPS 2004), 2004

Design and characterization of an and-or-inverter (AOI) gate for QCA implementation.
Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, 2004

Defect Characterization for Scaling of QCA Devices.
Proceedings of the 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 2004

2003
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment.
Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003


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