Nagothu Karmel Kranthi

According to our database, Nagothu Karmel Kranthi authored at least 10 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2023

Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress.

M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Current Scalability Issues in Multi-Bank 5V PMOS ESD structures: Root cause and Design Guideline.

Nagothu Karmel Kranthi, Yang Xiu, Yang Xiao, Rajkumar Sankaralingam

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices.

M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020

Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices.

Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts.

Nagothu Karmel Kranthi, Chirag Garg, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects.

Abhishek Mishra, Adil Meersha, Nagothu Karmel Kranthi, Kruti Trivedi, Harsha B. Variar, N. S. Veenadhari Bellamkonda, Srinivasan Raghavan, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior.

Nagothu Karmel Kranthi, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability.

Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes.

Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Mayank Shrivastava

Proceedings of the 31st International Conference on VLSI Design and 17th International Conference on Embedded Systems, 2018

Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs.

Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Harsha B. Variar, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2018