Gianluca Boselli

According to our database, Gianluca Boselli authored at least 15 papers between 2001 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2023

TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection.

Laura Zunarelli, Luigi Balestra, Susanna Reggiani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress.

M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

TCAD Investigation of Power-to-Failure Evaluation for Ultrafast Events in BJT-based ESD Protection Cells.

Laura Zunarelli, Susanna Reggiani, Elena Gnani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices.

M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020

Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices.

Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts.

Nagothu Karmel Kranthi, Chirag Garg, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior.

Nagothu Karmel Kranthi, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability.

Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2016

Improved inductive-system-level IEC ESD performance for automotive applications using mutual ballasted ESD protection technique.

Akram A. Salman, Farzan Farbiz, Ann Concannon, Hal Edwards, Gianluca Boselli

Microelectron. Reliab., 2016

2012

ESD design challenges in state-of-the-art analog technologies.

Gianluca Boselli

Microelectron. Reliab., 2012

Electronic design automation (EDA) solutions for ESD-robust design and verification.

Michael G. Khazhinsky, Shuqing Cao, Harald Gossner, Gianluca Boselli, Melanie Etherton

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2006

Gate oxide failures due to anomalous stress from HBM ESD testers.

Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline

Microelectron. Reliab., 2006

2005

A MOSFET power supply clamp with feedback enhanced triggering for ESD protection in advanced CMOS technologies.

Jeremy C. Smith, Gianluca Boselli

Microelectron. Reliab., 2005

Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies.

Gianluca Boselli, Charvaka Duvvury

Microelectron. Reliab., 2005

2001

Investigations on double-diffused MOS transistors under ESD zap conditions.

Gianluca Boselli, Stan Meeuwsen, Ton J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2001