Nasim Pour Aryan

According to our database, Nasim Pour Aryan authored at least 8 papers between 2012 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

Synthesis of DDRO Timing Monitors by Delay-Tracking and Static Timing Analysis.

Jahnavi Kasturi Rangan, Nasim Pour Aryan, Jens Bargfrede, Lantao Wang, Christian Funke, Helmut Graeb

IEEE Trans. Circuits Syst. I Regul. Pap., 2020

2018

Design-dependent Monitors Based on Delay Sensitivity Tracking.

Jahnavi Kasturi Rangan, Nasim Pour Aryan, Lantao Wang, Jens Bargfrede, Christian Funke, Helmut Graeb

Proceedings of the 25th IEEE International Conference on Electronics, Circuits and Systems, 2018

2016

In situ measurement of aging-induced performance degradation in digital circuits.

Nasim Pour Aryan, Christian Funke, Jens Bargfrede, Cenk Yilmaz, Doris Schmitt-Landsiedel, Georg Georgakos

Proceedings of the 21th IEEE European Test Symposium, 2016

2014

Power efficient digital IC design for a medical application with high reliability requirements.

Nasim Pour Aryan, Nils Heidmann, Martin Wirnshofer, Nico Hellwege, Jonas Pistor, Dagmar Peters-Drolshagen, Georg Georgakos, Steffen Paul, Doris Schmitt-Landsiedel

Proceedings of the 24th International Workshop on Power and Timing Modeling, 2014

From an analytic NBTI device model to reliability assessment of complex digital circuits.

Nasim Pour Aryan, A. Listl, Leonhard Heiß, Cenk Yilmaz, Georg Georgakos, Doris Schmitt-Landsiedel

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

2013

Reliability monitoring of digital circuits by in situ timing measurement.

Nasim Pour Aryan, Georg Georgakos, Doris Schmitt-Landsiedel

Proceedings of the 2013 23rd International Workshop on Power and Timing Modeling, 2013

2012

On-Line Supply voltage Scaling Based on <i>in situ</i> Delay Monitoring to Adapt for Pvta variations.

Martin Wirnshofer, Nasim Pour Aryan, Leonhard Heiß, Doris Schmitt-Landsiedel, Georg Georgakos

J. Circuits Syst. Comput., 2012

Adaptive voltage scaling by in-situ delay monitoring for an image processing circuit.

Martin Wirnshofer, Leonhard Heiß, Anil Narayan Kakade, Nasim Pour Aryan, Georg Georgakos, Doris Schmitt-Landsiedel

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012