Georg Georgakos

According to our database1, Georg Georgakos authored at least 26 papers between 2003 and 2019.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2019
From Device Aging Physics to Automated Circuit Reliability Sign Off.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2017
A new 3-bit burst-error correcting code.
Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2016
In situ measurement of aging-induced performance degradation in digital circuits.
Proceedings of the 21th IEEE European Test Symposium, 2016

2015
A fWLR test structure and method for device reliability monitoring using product relevant circuits.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
Power efficient digital IC design for a medical application with high reliability requirements.
Proceedings of the 24th International Workshop on Power and Timing Modeling, 2014

From an analytic NBTI device model to reliability assessment of complex digital circuits.
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

2013
Reliability monitoring of digital circuits by in situ timing measurement.
Proceedings of the 2013 23rd International Workshop on Power and Timing Modeling, 2013

Reliability challenges for electric vehicles: from devices to architecture and systems software.
Proceedings of the 50th Annual Design Automation Conference 2013, 2013

2012
On-Line Supply voltage Scaling Based on <i>in situ</i> Delay Monitoring to Adapt for Pvta variations.
J. Circuits Syst. Comput., 2012

Adaptive voltage scaling by in-situ delay monitoring for an image processing circuit.
Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2011
A variation-aware adaptive voltage scaling technique based on in-situ delay monitoring.
Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

2010
Aging-aware Timing Analysis of Combinatorial Circuits on Gate Level (Alterungsanalyse von kombinatorischen Schaltungen auf Gatterebene).
it Inf. Technol., 2010

2009
Aging analysis of circuit timing considering NBTI and HCI.
Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

Fast stability analysis of large-scale SRAM arrays and the impact of NBTI degradation.
Proceedings of the 35th European Solid-State Circuits Conference, 2009

2008
A Design Space Comparison of 6T and 8T SRAM Core-Cells.
Proceedings of the Integrated Circuit and System Design. Power and Timing Modeling, 2008

2007
A 90-nm CMOS Low-Power GSM/EDGE Multimedia-Enhanced Baseband Processor With 380-MHz ARM926 Core and Mixed-Signal Extensions.
IEEE J. Solid State Circuits, 2007

In-Situ Delay Characterization and Local Supply Voltage Adjustment for Compensation of Local Parametric Variations.
IEEE J. Solid State Circuits, 2007

Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena.
Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

Layout options for stability tuning of SRAM cells in multi-gate-FET technologies.
Proceedings of the 33rd European Solid-State Circuits Conference, 2007

2006
Dynamic state-retention flip-flop for fine-grained power gating with small design and power overhead.
IEEE J. Solid State Circuits, 2006

A 90nm CMOS low-power GSM/EDGE multimedia-enhanced baseband processor with 380MHz ARM9 and mixed-signal extensions.
Proceedings of the 2006 IEEE International Solid State Circuits Conference, 2006

2005
Dynamic state-retention flip flop for fine-grained sleep-transistor scheme.
Proceedings of the 31st European Solid-State Circuits Conference, 2005

2004
Two Level Compact Simulation Methodology for Timing Analysis of Power-Switched Circuits.
Proceedings of the Integrated Circuit and System Design, 2004

Single Supply Voltage High-Speed Semi-dynamic Level-Converting Flip-Flop with Low Power and Area Consumption.
Proceedings of the Integrated Circuit and System Design, 2004

2003
Impact of Gate Leakage on Efficiency of Circuit Block Switch-Off Schemes.
Proceedings of the VLSI-SOC: From Systems to Chips, 2003

Design Aspects and Technological Scaling Limits of ZigZag Circuit Block Switch-Off Schemes.
Proceedings of the IFIP VLSI-SoC 2003, 2003


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