Nur Engin

According to our database, Nur Engin authored at least 10 papers between 1996 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

Selective clipping and filtering: A low-EVM PAPR reduction scheme for OFDM standards.

Audrey Cuenin, Nur Engin

Proceedings of the 27th IEEE Annual International Symposium on Personal, 2016

Leakage mitigation for low power microcontroller design in 40nm for Internet-of-Things (IoT).

Ajay Kapoor, Nur Engin, Johan Verdaasdonk

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

2009

Rapid prototyping of a DVB-SH turbo decoder using high-level-synthesis.

Marko Rößler, Hailu Wang, Ulrich Heinkel, Nur Engin, Wolfram Drescher

Proceedings of the Forum on specification and Design Languages, 2009

2008

Multistandard FEC Decoders for Wireless Devices.

John Dielissen, Nur Engin, Sergei Sawitzki, Kees van Berkel

IEEE Trans. Circuits Syst. II Express Briefs, 2008

2007

Scalable reconfigurable channel decoder architecture for future wireless handsets.

Gummidipudi Krishnaiah, Nur Engin, Sergei Sawitzki

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

SAND: a modular application development platform for miniature wireless sensors.

Martin Ouwerkerk, Frank J. Pasveer, Nur Engin

Proceedings of the 2006 International Workshop on Wearable and Implantable Body Sensor Networks (BSN 2006), 2006

2003

Fast Fault Simulation for Nonlinear Analog Circuits.

Nur Engin, Hans G. Kerkhoff

IEEE Des. Test Comput., 2003

1999

Integrated Design and Test of Mixed-Signal Circuits.

Nur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek

J. Electron. Test., 1999

Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier.

R. H. Beurze, Y. Xing, R. van Kleef, Ronald J. W. T. Tangelder, Nur Engin

Proceedings of the 4th European Test Workshop, 1999

1996

MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation.

Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek, Nur Engin

Proceedings of Third International Conference on Electronics, Circuits, and Systems, 1996