Orazio P. Forlenza

According to our database, Orazio P. Forlenza authored at least 5 papers between 1989 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Testing the IBM Power 7™ 4 GHz eight core microprocessor.

James Crafts, David Bogdan, Dennis Conti, Donato O. Forlenza, Orazio P. Forlenza, William V. Huott, Mary P. Kusko, Edward Seymour, Timothy Taylor, Brian Walsh

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Structural and functional test of IBM System z10 chips.

Gerard Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, Orazio P. Forlenza, R. J. Frishmuth, Rona Yaari, S. Michnowski, U. Baur

IBM J. Res. Dev., 2009

On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC).

Franco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza

Proceedings of the 2009 IEEE International Test Conference, 2009

1990

Weighted random test program generation for a per-pin tester.

J. Gartner, B. Driscoll, Donato O. Forlenza, Orazio P. Forlenza, Timothy J. Koprowski, T. Lizambri, R. Olsen, S. Robertson, P. Ryan, A. Walter

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1989

A Method for Generating Weighted Random Test Patterns.

John A. Waicukauski, Eric Lindbloom, Edward B. Eichelberger, Orazio P. Forlenza

IBM J. Res. Dev., 1989