Franco Stellari

According to our database, Franco Stellari authored at least 34 papers between 2001 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2022

Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security.

Franco Stellari, Peilin Song

Proceedings of the IEEE International Test Conference, 2022

Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation.

Franco Stellari, Ernest Y. Wu, Martin M. Frank, Leonidas E. Ocala, Takashi Ando, Peilin Song

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022

2020

Benchmarking at the Frontier of Hardware Security: Lessons from Logic Locking.

Benjamin Tan, Ramesh Karri, Nimisha Limaye, Abhrajit Sengupta, Ozgur Sinanoglu, Md. Moshiur Rahman, Swarup Bhunia, Danielle Duvalsaint, Ronald D. Blanton, Amin Rezaei, Yuanqi Shen, Hai Zhou, Leon Li, Alex Orailoglu, Zhaokun Han, Austin Benedetti, Luciano Brignone, Muhammad Yasin, Jeyavijayan Rajendran, Michael Zuzak, Ankur Srivastava, Ujjwal Guin, Chandan Karfa, Kanad Basu, Vivek V. Menon, Matthew French, Peilin Song, Franco Stellari, Gi-Joon Nam, Peter Gadfort, Alric Althoff, Joseph Tostenrude, Saverio Fazzari, Eric Breckenfeld, Kenneth Plaks

CoRR, 2020

2019

Innovate Practices on CyberSecurity of Hardware Semiconductor Devices.

Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Case Study of Advanced Diagnostic Techniques for Multi Port Register File.

Uma Srinivasan, William V. Huott, Chad Adams, Pete Freiburger, Franco Stellari, Peilin Song, Phong Tran, Dave Albert

Proceedings of the 28th IEEE North Atlantic Test Workshop, 2019

2018

Estimating transistor channel temperature using time-resolved and time-integrated NIR emission.

Franco Stellari, Alan J. Weger, Keith A. Jenkins, Giuseppe La Rosa, Barry P. Linder, Peilin Song

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Novel IC Sub-Threshold IDDQ Signature And Its Relationship To Aging During High Voltage Stress.

Franco Stellari, Naigang Wang, Peilin Song

Proceedings of the 48th European Solid-State Device Research Conference, 2018

2016

Revealing SRAM memory content using spontaneous photon emission.

Franco Stellari, Peilin Song, Manuel Villalobos, John Sylvestri

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015

Self-heating characterization of FinFET SOI devices using 2D time resolved emission measurements.

Franco Stellari, Keith A. Jenkins, Alan J. Weger, Barry P. Linder, Peilin Song

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Time-integrated photon emission as a function of temperature in 32 nm CMOS.

Andrea Bahgat Shehata, Alan J. Weger, Franco Stellari, Peilin Song, Hervé Deslandes, Ted R. Lundquist, Euan Ramsay

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Functional block extraction for hardware security detection using time-integrated and time-resolved emission measurements.

Franco Stellari, Peilin Song, Herschel A. Ainspan

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Counterfeit IC detection using light emission.

Peilin Song, Franco Stellari, Alan J. Weger

Proceedings of the 2014 International Test Conference, 2014

Verification of untrusted chips using trusted layout and emission measurements.

Franco Stellari, Peilin Song, Alan J. Weger, Jim Culp, A. Herbert, Dirk Pfeiffer

Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, 2014

2012

Tester-based optical and electrical diagnostic system and techniques.

Peilin Song, Franco Stellari

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Root cause identification of an hard-to-find on-chip power supply coupling fail.

Franco Stellari, Thomas Cowell, Peilin Song, Michael Sorna, Zeynep Toprak Deniz, John F. Bulzacchelli, Nandita A. Mitra

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

MARVEL - Malicious alteration recognition and verification by emission of light.

Peilin Song, Franco Stellari, Dirk Pfeiffer, Jim Culp, Alan J. Weger, Alyssa Bonnoit, Bob Wisnieff, Marc Taubenblatt

Proceedings of the HOST 2011, 2011

2010

Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor.

Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy

IEEE Trans. Circuits Syst. I Regul. Pap., 2010

2009

On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC).

Franco Stellari, Peilin Song, John Sylvestri, D. Miles, Orazio P. Forlenza, Donato O. Forlenza

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

Optical Diagnostics for IBM POWER6- Microprocessor.

Peilin Song, Stephen Ippolito, Franco Stellari, John Sylvestri, Tim Diemoz, George Smith, Paul Muench, Norm James, Seongwon Kim, Hector Saenz

Proceedings of the 2008 IEEE International Test Conference, 2008

A high sensitivity process variation sensor utilizing sub-threshold operation.

Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy

Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008

2006

High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images.

Franco Stellari, Peilin Song, Tim Diemoz, Alan J. Weger, Tami Vogel, Steve Wilson, John Pennings, Richard F. Rizzolo

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Innovative packaging technique for backside optical testing of wire-bonded chips.

Alberto Tosi, Franco Stellari, Franco Zappa

Microelectron. Reliab., 2005

Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE).

Franco Stellari, Peilin Song, John Hryckowian, Otto A. Torreiter, Steve Wilson, Philip Wu, Alberto Tosi

Microelectron. Reliab., 2005

An advanced optical diagnostic technique of IBM z990 eServer microprocessor.

Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

CMOS circuit testing via time-resolved luminescence measurements and simulations.

Franco Stellari, Alberto Tosi, Franco Zappa, Sergio Cova

IEEE Trans. Instrum. Meas., 2004

Current crowding in faulty MOSFET: optical and electrical investigation.

Alberto Tosi, Franco Stellari, Franco Zappa

Microelectron. Reliab., 2004

Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD).

Franco Stellari, Peilin Song

Microelectron. Reliab., 2004

A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current.

Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Backside Flip-Chip testing by means of high-bandwidth luminescence detection.

Alberto Tosi, Franco Stellari, Franco Zappa, Sergio Cova

Microelectron. Reliab., 2003

Latchup Analysis Using Emission Microscopy.

Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda, Philip Wu, Steve Wilson

Microelectron. Reliab., 2003

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.

Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari

Microelectron. Reliab., 2003

Optical and Electrical Testing of Latchup in I/O Interface Circuits.

Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Optical diagnosis of excess I_DDQ in low power CMOS circuits.

Franco Stellari, Peilin Song, James C. Tsang, Moyra K. McManus, Mark B. Ketchen

Microelectron. Reliab., 2002

2001

Tools for contactless testing and simulation of CMOS circuits.

Franco Stellari, Franco Zappa, Sergio Cova, L. Vendrame

Microelectron. Reliab., 2001