John A. Waicukauski
According to our database1,
John A. Waicukauski
authored at least 43 papers
between 1981 and 2018.
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Bibliography
2018
Proceedings of the IEEE International Test Conference, 2018
2017
Proceedings of the 54th Annual Design Automation Conference, 2017
2014
Proceedings of the 2014 International Test Conference, 2014
2013
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
Proceedings of the 2013 IEEE International Test Conference, 2013
2012
Proceedings of the 30th IEEE VLSI Test Symposium, 2012
Proceedings of the 2012 IEEE International Test Conference, 2012
2010
Proceedings of the 2011 IEEE International Test Conference, 2010
Proceedings of the 2011 IEEE International Test Conference, 2010
Proceedings of the 47th Design Automation Conference, 2010
2008
Proceedings of the 2008 IEEE International Test Conference, 2008
2007
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
Proceedings of the 2007 IEEE International Test Conference, 2007
2005
Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
2004
Proceedings of the 41th Design Automation Conference, 2004
2003
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
Efficient compression and application of deterministic patterns in a logic BIST architecture.
Proceedings of the 40th Design Automation Conference, 2003
2002
Scan Test Data Volume Reduction in Multi-Clocked Designs with Safe Capture Technique.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002
Proceedings of the 39th Design Automation Conference, 2002
2001
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001
2000
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000
1999
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999
1998
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998
1997
Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997
1996
Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996
Proceedings of the Proceedings IEEE International Test Conference 1996, 1996
Test Generation for Ultra-Large Circuits Using ATPG Constraints and Test-Pattern Templates.
Proceedings of the Proceedings IEEE International Test Conference 1996, 1996
Proceedings of the Proceedings IEEE International Test Conference 1996, 1996
1990
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990
Proceedings of the Proceedings IEEE International Test Conference 1990, 1990
1989
1988
Proceedings of the Proceedings International Test Conference 1988, 1988
Proceedings of the Proceedings International Test Conference 1988, 1988
1987
1986
Transition Fault Simulation by Parallel Pattern Single Fault Propagation.
Proceedings of the Proceedings International Test Conference 1986, 1986
1985
A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation.
Proceedings of the Proceedings International Test Conference 1985, 1985
1983
An LSSD Pseudo Random Pattern Test System.
Proceedings of the Proceedings International Test Conference 1983, 1983
1981
Fault Diagnosis in an LSSD Environment.
Proceedings of the Proceedings International Test Conference 1981, 1981