Paolo Spirito
According to our database1,
Paolo Spirito
authored at least 11 papers
between 1990 and 2012.
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Bibliography
2012
3D electro-thermal simulations of wide area power devices operating in avalanche condition.
Microelectron. Reliab., 2012
2010
A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing.
Microelectron. Reliab., 2010
Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography.
Microelectron. Reliab., 2010
2009
1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention.
Microelectron. Reliab., 2009
2008
Microelectron. Reliab., 2008
2007
New developments of THERMOS<sup>3</sup>, a tool for 3D electro-thermal simulation of smart power MOSFETs.
Microelectron. Reliab., 2007
Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell.
Microelectron. Reliab., 2007
2006
Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode.
Microelectron. Reliab., 2006
2005
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation.
Microelectron. Reliab., 2005
2004
Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching.
Microelectron. Reliab., 2004
1990
A new test structure for recombination measurements in thin si layers for VLSI structures.
Eur. Trans. Telecommun., 1990