Philippe Debaud

According to our database, Philippe Debaud authored at least 16 papers between 2012 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Predictor BIST: An "All-in-One" Optical Test Solution for CMOS Image Sensors.

J. Lefevre, P. Debaud, P. Girard, Arnaud Virazel

Proceedings of the IEEE International Test Conference, 2023

2022

A Generic Fast and Low Cost BIST Solution for CMOS Image Sensors.

J. Lefevre, P. Debaud, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE European Test Symposium, 2022

2021

A Fast and Low Cost Embedded Test Solution for CMOS Image Sensors.

J. Lefevre, Philippe Debaud, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE International Test Conference, 2021

2019

Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVS.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

J. Electron. Test., 2019

2018

Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

An industrial case study of low cost adaptive voltage scaling using delay test patterns.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

Industrial evaluation of transition fault testing for cost effective offline adaptive voltage scaling.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017

Using transition fault test patterns for cost effective offline performance estimation.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

Proceedings of the 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2017

2016

Design for Test and Diagnosis of Power Switches.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Philippe Debaud, Stephane Guilhot

J. Circuits Syst. Comput., 2016

Industrial approaches for performance evaluation using on-chip monitors.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars

Proceedings of the 11th International Design & Test Symposium, 2016

Auto-adaptive ultra-low power IC.

Alberto Bosio, Philippe Debaud, Patrick Girard, Stephane Guilhot, Miroslav Valka, Arnaud Virazel

Proceedings of the 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2016

Challenges of using on-chip performance monitors for process and environmental variation compensation.

Mahroo Zandrahimi, Zaid Al-Ars, Philippe Debaud, Armand Castillejo

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2015

Design-for-Diagnosis Architecture for Power Switches.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, P. Debaud, S. Guilhot

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014

iBoX - Jitter based Power Supply Noise sensor.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot

Proceedings of the 19th IEEE European Test Symposium, 2014

Test and diagnosis of power switches.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot

Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014

2012

Power Supply Noise Sensor Based on Timing Uncertainty Measurements.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, P. Debaud, S. Guilhot

Proceedings of the 21st IEEE Asian Test Symposium, 2012