Miroslav Valka

According to our database, Miroslav Valka authored at least 12 papers between 2011 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Design for Test and Diagnosis of Power Switches.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Philippe Debaud, Stephane Guilhot

J. Circuits Syst. Comput., 2016

Auto-adaptive ultra-low power IC.

Alberto Bosio, Philippe Debaud, Patrick Girard, Stephane Guilhot, Miroslav Valka, Arnaud Virazel

Proceedings of the 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2016

2015

High frequency jitter estimator for SoCs.

Hervé Le Gall, Rshdee Alhakim, Miroslav Valka, Salvador Mir, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu

Proceedings of the 20th IEEE European Test Symposium, 2015

Design-for-Diagnosis Architecture for Power Switches.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, P. Debaud, S. Guilhot

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014

iBoX - Jitter based Power Supply Noise sensor.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot

Proceedings of the 19th IEEE European Test Symposium, 2014

Test and diagnosis of power switches.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot

Proceedings of the 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2014

2013

Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption.

Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Miroslav Valka, Patrick Girard

J. Low Power Electron., 2013

2012

Power Supply Noise Sensor Based on Timing Uncertainty Measurements.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, P. Debaud, S. Guilhot

Proceedings of the 21st IEEE Asian Test Symposium, 2012

Peak Power Estimation: A Case Study on CPU Cores.

Paolo Bernardi, Mauricio de Carvalho, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Bosio, Luigi Dilillo, Patrick Girard, Miroslav Valka

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing.

Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Ernesto Sánchez, Mauricio de Carvalho, Matteo Sonza Reorda

Proceedings of the 16th European Test Symposium, 2011

Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector.

Luigi Dilillo, Alberto Bosio, Miroslav Valka, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

Power consumption traces realignment to improve differential power analysis.

Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Miroslav Valka, Denis Réal

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011