Philippe Descamps

According to our database1, Philippe Descamps authored at least 15 papers between 2002 and 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2019
Applied TRL Calibration Method to Differential Devices Embedded in a Test Board.
Proceedings of the IEEE Radio and Wireless Symposium, 2019

2017
Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism.
Proceedings of the IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29, 2017

2016
An Experience of Engineering of MAS for Smart Environments: Extension of ASPECS.
Proceedings of the Intelligent Interactive Multimedia Systems and Services 2016, 2016

2015
Multi-Agent System for intelligent Scrum project management.
Integr. Comput. Aided Eng., 2015

An Analysis and Prototyping Approach for Cyber-Physical Systems.
Proceedings of the 10th International Conference on Future Networks and Communications (FNC 2015) / The 12th International Conference on Mobile Systems and Pervasive Computing (MobiSPC 2015) / Affiliated Workshops, 2015

2013
Reducing substrate noise coupling in a 3D-PICS Integrated Passive Device by localized P+ guard rings.
Proceedings of the IEEE Topical Conference on Wireless Sensors and Sensor Networks, 2013

2012
Influence of the output harmonic networks of classes F and F<sup>-1</sup> power amplifiers in LINC systems.
Proceedings of the 10th IEEE International NEWCAS Conference, 2012

Performances of RF PA classes in LINC systems.
Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

2008
Determination of temperature change inside IC packages during laser ablation of molding compound.
Microelectron. Reliab., 2008

2005
Isolating failing sites in IC packages using time domain reflectometry: Case studies.
Microelectron. Reliab., 2005

2004
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.
Microelectron. Reliab., 2004

Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current.
Microelectron. Reliab., 2004

2003
Magnetic emission mapping for passive integrated components characterisation.
Microelectron. Reliab., 2003

2002
Comprehensive failure analysis of leakage faults in bipolar transistors.
Microelectron. Reliab., 2002

Magnetic field measurements for Non Destructive Failure Analysis.
Microelectron. Reliab., 2002


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