Gérald Haller

According to our database, Gérald Haller authored at least 15 papers between 2002 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Effects of 1064 nm laser on MOS capacitor.

R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2012

2011

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory.

Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2011

2009

Net integrity checking by optical localization techniques.

Gérald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget

Microelectron. Reliab., 2009

2008

Effect of physical defect on shmoos in CMOS DSM technologies.

Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely

Microelectron. Reliab., 2008

Generic simulator for faulty IC.

Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier

Microelectron. Reliab., 2008

2007

Investigation of a new method for dopant characterization.

Jérôme Adrian, Nicolas Rodriguez, Fabien Essely, Gérald Haller, Catherine Grosjean, Alain Portavoce, Christophe Girardeaux

Microelectron. Reliab., 2007

2006

Evaluation of scanning capacitance microscopy sample preparation by focused ion beam.

Nicolas Rodriguez, Jérôme Adrian, Catherine Grosjean, Gérald Haller, Christophe Girardeaux, Alain Portavoce

Microelectron. Reliab., 2006

2005

Impact of semiconductors material on IR Laser Stimulation signal.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2005

2004

Automated Diagnosis and Probing Flow for Fast Fault Localization in IC.

D. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs

Microelectron. Reliab., 2004

Understanding the effects of NIR laser stimulation on NMOS transistor.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2004

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.

Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti

Microelectron. Reliab., 2004

2003

Short defect characterization based on TCR parameter extraction.

Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis

Microelectron. Reliab., 2003

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.

Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2003

2002

Backside Hot Spot Detection Using Liquid Crystal Microscopy.

Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis

Microelectron. Reliab., 2002

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.

Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis

Microelectron. Reliab., 2002