Abdellatif Firiti

According to our database, Abdellatif Firiti authored at least 7 papers between 2003 and 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2008

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs.

Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis

Microelectron. Reliab., 2008

2007

A new method to quantify retention-failed cells of an EEPROM CAST.

Claire Le Roux, Laurent Lopez, Abdellatif Firiti, Jean-Luc Ogier, Frédéric Lalande, Romain Laffont, Gilles Micolau

Microelectron. Reliab., 2007

2005

Impact of semiconductors material on IR Laser Stimulation signal.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2005

2004

Understanding the effects of NIR laser stimulation on NMOS transistor.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2004

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.

Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti

Microelectron. Reliab., 2004

2003

Short defect characterization based on TCR parameter extraction.

Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis

Microelectron. Reliab., 2003

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.

Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2003