Romain Desplats

According to our database, Romain Desplats authored at least 28 papers between 2001 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards.

Christophe De Nardi, Romain Desplats, Philippe Perdu, Jean-Luc Gauffier, Christophe Guérin

Microelectron. Reliab., 2006

2005

NIR laser stimulation for dynamic timing analysis.

Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis

Microelectron. Reliab., 2005

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis.

Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit

Microelectron. Reliab., 2005

Oxide charge measurements in EEPROM devices.

C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier

Microelectron. Reliab., 2005

Failure analysis of micro-heating elements suspended on thin membranes.

Danick Briand, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu

Microelectron. Reliab., 2005

Dynamic Laser Stimulation Case Studies.

Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte

Microelectron. Reliab., 2005

2004

Implementation of TRE systems into Emission Microscopes.

Alberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu

Microelectron. Reliab., 2004

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?

Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis

Microelectron. Reliab., 2004

Automated Diagnosis and Probing Flow for Fast Fault Localization in IC.

D. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs

Microelectron. Reliab., 2004

Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections.

Romain Desplats, S. Petit, Sana Rezgui, Carl Carmichael, Pascal Fouillat, Dean Lewis

Microelectron. Reliab., 2004

Time Resolved Photon Emission Processing Flow for IC Analysis.

Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2004

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems.

Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti

Microelectron. Reliab., 2004

Femtosecond Laser Ablation for Backside Silicon Thinning.

Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu

Microelectron. Reliab., 2004

2003

Solar Cell Analysis with Light Emission and OBIC Techniques.

Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu

Microelectron. Reliab., 2003

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations.

Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2003

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.

Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari

Microelectron. Reliab., 2003

Magnetic emission mapping for passive integrated components characterisation.

Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina

Microelectron. Reliab., 2003

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.

Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2003

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles

Microelectron. Reliab., 2003

Fault Localization using Time Resolved Photon Emission and STIL Waveforms.

Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

IR confocal laser microscopy for MEMS Technological Evaluation.

Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats

Microelectron. Reliab., 2002

Backside Hot Spot Detection Using Liquid Crystal Microscopy.

Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis

Microelectron. Reliab., 2002

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.

Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis

Microelectron. Reliab., 2002

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices.

Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement

Microelectron. Reliab., 2002

2001

A New Versatile Testing Interface for Failure Analysis in Integrated Circuits.

Romain Desplats, Philippe Perdu, Felix Beaudoin

Microelectron. Reliab., 2001

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.

Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis

Microelectron. Reliab., 2001

Silicon Thinning and Polishing on Packaged Devices.

Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis

Microelectron. Reliab., 2001

Modeling Thermal Laser Stimulation.

Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis

Microelectron. Reliab., 2001