Pramodchandran N. Variyam

According to our database, Pramodchandran N. Variyam authored at least 19 papers between 1997 and 2010.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2010

Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices.

Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam

J. Electron. Test., 2010

2006

DIBPro: Automatic Diagnostic Program Generation Tool.

Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers.

Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee

Proceedings of the 10th European Test Symposium, 2005

2004

Partial Bi-Immunity and NP-Completeness

John M. Hitchcock, Aduri Pavan, Pramodchandran N. Variyam

Electron. Colloquium Comput. Complex., 2004

2003

Automatic Diagnostic Program Generation for Mixed Signal Load Board.

Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Prediction of analog performance parameters using fast transienttesting.

Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

Measuring Stray Capacitance on Tester Hardware.

Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2000

Specification-driven test generation for analog circuits.

Pramodchandran N. Variyam, Abhijit Chatterjee

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling.

Pramodchandran N. Variyam, Abhijit Chatterjee

IEEE Des. Test Comput., 2000

Measuring code edges of ADCs using interpolation and its application to offset and gain error testing.

Pramodchandran N. Variyam, Vinay Agrawal

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Increasing the IDDQ test resolution using current prediction.

Pramodchandran N. Variyam

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation.

Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

Test Generation for Analog Circuits Using Partial Numerical Simulation.

Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee

Proceedings of the 12th International Conference on VLSI Design (VLSI Design 1999), 1999

1998

Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits.

Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements.

Pramodchandran N. Variyam, Abhijit Chatterjee

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Specification-Driven Test Design for Analog Circuits.

Pramodchandran N. Variyam, Abhijit Chatterjee

Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

1997

Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling.

Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

FLYER: Fast Fault Simulation of Linear Analog Circuits Using Polynomial Waveform and Perturbed State Representation.

Pramodchandran N. Variyam, Abhijit Chatterjee

Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

Test generation for comprehensive testing of linear analog circuits using transient response sampling.

Pramodchandran N. Variyam, Abhijit Chatterjee

Proceedings of the 1997 IEEE/ACM International Conference on Computer-Aided Design, 1997