Bruce C. Kim

According to our database, Bruce C. Kim authored at least 56 papers between 1991 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2018

Design of 3D Inductors for IoT Security.

Bruce C. Kim, Sang-Bock Cho

Proceedings of the International SoC Design Conference, 2018

2017

Modeling and Crosstalk Evaluation of 3-D TSV-Based Inductor With Ground TSV Shielding.

Saikat Mondal, Sang-Bock Cho, Bruce C. Kim

IEEE Trans. Very Large Scale Integr. Syst., 2017

2016

Recent advances in TSV inductors for 3D IC technology.

Bruce C. Kim, Sang-Bock Cho

Proceedings of the International SoC Design Conference, 2016

Text information acquisition method of traffic signs for autonomous navigation.

Hyun-Tae Kim, Jin-Seong Jeong, Bruce C. Kim, Sang-Bock Cho

Proceedings of the 2016 IEEE Asia Pacific Conference on Circuits and Systems, 2016

Wide rear vehicle recognition using a fisheye lens camera image.

Jin-Seong Jeong, Hyun-Tae Kim, Bruce C. Kim, Sang-Bock Cho

Proceedings of the 2016 IEEE Asia Pacific Conference on Circuits and Systems, 2016

2014

A novel BIST technique for LDMOS drivers.

Bruce C. Kim, Saikat Mondal, Friedrich Taenzler, Kenneth Moushegian

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

2013

Physics-Based Low-Cost Test Technique for High Voltage LDMOS.

Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi

J. Electron. Test., 2013

Physics Based Fault Models for Testing High-Voltage LDMOS.

Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Friedrich Taenzler, Richard Antley, Ken Moushegian

Proceedings of the 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, 2013

Development of hybrid electrical model for CNT based Through Silicon Vias.

Kaushal Kannan, Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho

Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

Design of nanosensing platform based on zinc oxide nanowire arrays.

Anurag Gupta, Mitchell Spryn, Bruce C. Kim, Eugene Edwards, Christina Brantley, Paul Ruffin

Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

2012

Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects.

Sukeshwar Kannan, Bruce C. Kim, Byoungchul Ahn

J. Electron. Test., 2012

Modeling and characterization of CNT-based TSV for high frequency applications.

Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Seok-Ho Noh, Li Li, Sang-Bock Cho

Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

Analysis of propagation delay in 3 - D stacked DRAM.

Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho, Byoungchul Ahn

Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

2011

Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme.

Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force

J. Electron. Test., 2011

2010

RADPro: Automatic RF analyzer and diagnostic program generation tool.

Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Automatic diagnostic tool for Analog-Mixed Signal and RF load boards.

Sukeshwar Kannan, Bruce C. Kim

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

Guest Editors' Introduction: The Evolution of RFIC Design and Test.

Bruce C. Kim, Craig Force

IEEE Des. Test Comput., 2008

TTTC Newsletter.

Bruce C. Kim

IEEE Des. Test Comput., 2008

2007

Test Technology Newsletter - December 2007.

Bruce C. Kim

J. Electron. Test., 2007

Test Technology Newsletter - October 2007.

Bruce C. Kim

J. Electron. Test., 2007

Test Technology Newsletter April 2007.

Bruce C. Kim

J. Electron. Test., 2007

Test Technology Newsletter.

Bruce C. Kim

J. Electron. Test., 2007

Low cost automatic mixed-signal board test using IEEE 1149.4.

Srividya Sundar, Bruce C. Kim, Toby Byrd, Felipe Toledo, Sudhir Wokhlu, Erika Beskar, Raul Rousselin, David Cotton, Gary Kendall

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

A new low-cost RF built-in self-test measurement for system-on-chip transceivers.

Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla

IEEE Trans. Instrum. Meas., 2006

A Novel RF Test Scheme Based on a DFT Method.

Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla

J. Electron. Test., 2006

Guest Editors' Introduction: Big Innovations in Small Packages.

Bruce C. Kim, Yervant Zorian

IEEE Des. Test Comput., 2006

Test Technology TC Newsletter.

Bruce C. Kim

IEEE Des. Test Comput., 2006

Session Abstract.

Yervant Zorian, Bruce C. Kim

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

DIBPro: Automatic Diagnostic Program Generation Tool.

Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers.

Jee-Youl Ryu, Bruce C. Kim

Microelectron. J., 2005

Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit.

Jee-Youl Ryu, Bruce C. Kim

J. Electron. Test., 2005

The Newsletter of Test Technology Council of the IEEE Computer Society.

Bruce C. Kim

J. Electron. Test., 2005

Test Technology Technical Council Newsletter.

Bruce C. Kim

J. Electron. Test., 2005

Advanced Mems for High Power Integrated Distribution Systems.

Rahim Kasim, Bruce C. Kim, Josef Drobnik

Proceedings of the 2005 International Conference on MEMS, 2005

2004

A new design for built-in self-test of 5GHz low noise amplifiers.

Jee-Youl Ryu, Bruce C. Kim

Proceedings of the Proceedings 2004 IEEE International SOC Conference, 2004

A new BIST scheme for 5GHz low noise amplifiers.

Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla

Proceedings of the 9th European Test Symposium, 2004

2003

Impact of Parameter Imbalances on Transmit Diversity OFDM System Performance.

Kyung-Geun Lee, Hyoung-Kyu Song, Mi-Jeong Kim, Sang-Tae Kim, Bruce C. Kim, Young-Hwan You

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2003

Automatic Diagnostic Program Generation for Mixed Signal Load Board.

Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

MEMS Spring Probe for Next Generation Wafer Level Testing.

Kee-Keun Lee, Bruce C. Kim

Proceedings of the 2003 International Conference on MEMS, 2003

RF MEMS Switch for Wireless LAN Applications.

Kee-Keun Lee, Bruce C. Kim

Proceedings of the 2003 International Conference on MEMS, 2003

Benzocyclobutene (BCB) Based Intracortical Neural Implant.

Kee-Keun Lee, Jiping He, Amarjit Singh, Bruce C. Kim

Proceedings of the 2003 International Conference on MEMS, 2003

An Approach for Selection of Test Points for Analog Fault Diagnosis.

Kranthi K. Pinjala, Bruce C. Kim

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

1999

A Novel Test Methodology for MEMS Magnetic Micromotors.

Bruce C. Kim, Krishna Marella

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

A probe scheduling algorithm for MCM substrates.

Bruce C. Kim, Pinshan Jiang, Se Hyun Park

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

A Novel Routing Algorithm for MCM Substrate Verification Using Single-Ended Prob.

Rongchang Yan, Bruce C. Kim

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

A high throughput test methodology for MCM substrates.

Bruce C. Kim, David C. Keezer, Abhijit Chatterjee

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

A Survey of Test Techniques for MCM Substrates.

Madhavan Swaminathan, Bruce C. Kim, Abhijit Chatterjee

J. Electron. Test., 1997

Analog and Mixed-Signal Benchmark Circuits-First Release.

Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

DC Built-In Self-Test for Linear Analog Circuits.

Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi

IEEE Des. Test Comput., 1996

Low-cost diagnosis of defects in MCM substrate interconnections.

Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

Low-cost DC built-in self-test of linear analog circuits using checksums.

Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi

Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

An integrated network management system: the design for AIN and B-ISDN.

Bruce C. Kim, Hisao Fujikawa, Tetsuji Tamaka

Proceedings of the 1996 Network Operations and Management Symposium, 1996

1995

A Novel Low-Cost Approach to MCM Interconnect Test.

Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

A Methodology for Generation and Collection of Multiprocessor Traces.

Paul J. Bond, Bruce C. Kim, Christopher A. Lee, David E. Schimmel

Proceedings of the MASCOTS '94, Proceedings of the Second International Workshop on Modeling, Analysis, and Simulation On Computer and Telecommunication Systems, January 31, 1994

1992

Network Performance Monitoring And Fault Detection On The Gtnet.

Philip W. Mathis, Bruce C. Kim

Proceedings of the Network Without Bounds: Network Operations and Management Symposium, 1992

1991

Defense data network management system.

Bruce C. Kim

Proceedings of the 16th Conference on Local Computer Networks, 1991