Naveena Nagi

According to our database1, Naveena Nagi authored at least 17 papers between 1992 and 1999.

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Bibliography

1999
Test Metrics for Analog Parametric Faults.
Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

1998
Signature analysis for analog and mixed-signal circuit test response compaction.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998

Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits.
Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

1997
Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling.
Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial.
Proceedings of the 10th International Conference on VLSI Design (VLSI Design 1997), 1997

A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996
A unified approach for fault simulation of linear mixed-signal circuits.
J. Electron. Test., 1996

DC Built-In Self-Test for Linear Analog Circuits.
IEEE Des. Test Comput., 1996

Low-cost DC built-in self-test of linear analog circuits using checksums.
Proceedings of the 9th International Conference on VLSI Design (VLSI Design 1996), 1996

1995
Efficient multisine testing of analog circuits.
Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

1994
A Signature Analyzer for Analog and Mixed-signal Circuits.
Proceedings of the Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1994

1993
Fault simulation of linear analog circuits.
J. Electron. Test., 1993

MIXER: Mixed-Signal Fault Simulator.
Proceedings of the Proceedings 1993 International Conference on Computer Design: VLSI in Computers & Processors, 1993

Fault-based automatic test generator for linear analog circuits.
Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993

DRAFTS: Discretized Analog Circuit Fault Simulator.
Proceedings of the 30th Design Automation Conference. Dallas, 1993

1992
Delay fault testing of iterative arithmetic arrays.
Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992

Hierarchical fault modeling for analog and mixed-signal circuits.
Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992


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