Priyamvada Vijayakumar

According to our database, Priyamvada Vijayakumar authored at least 7 papers between 2010 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of two.

2012

On lithography aware metal-fill insertion.

Vikram B. Suresh, Priyamvada Vijayakumar, Sandip Kundu

Proceedings of the Thirteenth International Symposium on Quality Electronic Design, 2012

2011

Impact of nanomanufacturing flow on systematic yield losses in nanoscale fabrics.

Priyamvada Vijayakumar, Pritish Narayanan, Israel Koren, C. Mani Krishna, Csaba Andras Moritz

Proceedings of the 2011 IEEE/ACM International Symposium on Nanoscale Architectures, 2011

Nanoscale Application Specific Integrated Circuits.

Pritish Narayanan, Jorge Kina, Pavan Panchapakeshan, Priyamvada Vijayakumar, Kyeong-Sik Shin, Mostafizur Rahman, Michael Leuchtenburg, Israel Koren, Chi On Chui, Csaba Andras Moritz

Proceedings of the 2011 IEEE/ACM International Symposium on Nanoscale Architectures, 2011

Lithography aware critical area estimation and yield analysis.

Priyamvada Vijayakumar, Vikram B. Suresh, Sandip Kundu

Proceedings of the 2011 IEEE International Test Conference, 2011

On Screening Reliability Using Lithographic Process Corner Information Gleaned from Tester Measurements.

Vikram B. Suresh, Priyamvada Vijayakumar, Sandip Kundu

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2011

Biased Voting for Improved Yield in Nanoscale Fabrics.

Md. Muwyid U. Khan, Pritish Narayanan, Priyamvada Vijayakumar, Israel Koren, C. Mani Krishna, Csaba Andras Moritz

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

2010

Incorporating Heterogeneous Redundancy in a Nanoprocessor for Improved Yield and Performance.

Priyamvada Vijayakumar, Pritish Narayanan, Israel Koren, C. Mani Krishna, Csaba Andras Moritz

Proceedings of the 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010