Rainer Duschl

According to our database, Rainer Duschl authored at least 5 papers between 2001 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2017

Static and dynamic hot carrier accelerated TDDB: Influencing factors and impact on product lifetime.

Rainer Duschl, Armin H. Fischer, Achim Gratz, Robert Wiesner

Microelectron. Reliab., 2017

2007

Reliability aspects of Hf-based capacitors: Breakdown and trapping effects.

Rainer Duschl, Martin Kerber, A. Avellan, S. Jakschik, Uwe Schroeder, S. Kudelka

Microelectron. Reliab., 2007

2005

Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products.

Gerald Neumann, J. Touzel, Rainer Duschl

Microelectron. Reliab., 2005

Is the power-law model applicable beyond the direct tunneling regime?

Rainer Duschl, Rolf-Peter Vollertsen

Microelectron. Reliab., 2005

2001

Tunnelling Diode Technology.

Werner Prost, Uwe Auer, Franz-Josef Tegude, Christian Pacha, Karl Goser, Rainer Duschl, K. Eberl, O. Schmidt

Proceedings of the 31st IEEE International Symposium on Multiple-Valued Logic, 2001