Ravi K. Gulati

According to our database, Ravi K. Gulati authored at least 10 papers between 1988 and 1996.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1996

Improving Gate Level Fault Coverage by RTL Fault Grading.

Weiwei Mao, Ravi K. Gulati

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1994

Structure and Metrology for a Single-wire Analog.

Yunsheng Lu, Weiwei Mao, Ramaswami Dandapani, Ravi K. Gulati

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1992

IDDQ testing: A review.

Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao

J. Electron. Test., 1992

Quietest: A methodology for selecting IDDQ test vectors.

Weiwei Mao, Ravi K. Gulati

J. Electron. Test., 1992

Introduction.

Ravi K. Gulati, Charles F. Hawkins

J. Electron. Test., 1992

Detection of "Undetectable" Faults Using I_DDQ Testing.

Ravi K. Gulati, Weiwei Mao, Deepak K. Goel

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1990

Bridging faults and their implication to PLAs.

V. Chandramouli, Ravi K. Gulati, Ramaswami Dandapani, Deepak K. Goel

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

QUIETEST: A Quiescent Current Testing Methodology for Detecting Leakage Faults.

Weiwei Mao, Ravi K. Gulati, Deepak K. Goel, Michael D. Ciletti

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 1990

1988

An efficient compaction algorithm for test vectors of microprocessors and microcontrollers.

Ravi K. Gulati, Deepak K. Goel

Proceedings of the 1988 IEEE International Conference on Computer-Aided Design, 1988

Built-in self-test for large embedded CMOS folded PLAs.

Ramaswami Dandapani, Ravi K. Gulati, Deepak K. Goel

Proceedings of the 1988 IEEE International Conference on Computer-Aided Design, 1988