Weiwei Mao

According to our database, Weiwei Mao authored at least 23 papers between 1986 and 2026.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of four.

2026

English Vowel Feature Extraction Based on Interpolated Wavelet Pyramid Decomposition.

Weiwei Mao, Xu Gong, Yantao Duan, Zhiguo Zhang

Circuits Syst. Signal Process., February, 2026

Augmenting fuzzy rule-based models through random sampling and instance-specific model learning.

Weiwei Mao, Witold Pedrycz, Xiubin Zhu, Zhiwu Li

Fuzzy Sets Syst., 2026

2024

Short-Term Power Load Forecasting Method Based on GRU-Transformer Combined Neural Network Model.

Weiwei Mao, Suping Yu, Wenqing Chen

J. Comput. Inf. Technol., 2024

Analysis of the Research Progress of Electromagnetic Railgun Based on CiteSpace.

Weiwei Mao, Teng Pang, Zhirong Guo, Hongbao Bai, Zhixiong Huang, Xiaoyu Jin

IEEE Access, 2024

2022

Slicing-Tracking-Detection: Simultaneous Multi-Cylinder Detection From Large-Scale and Complex Point Clouds.

Zhuheng Lu, Weiwei Mao, Yuewei Dai, Weiqing Li, Zhiyong Su

IEEE Trans. Vis. Comput. Graph., 2022

2020

Partial Matching of Large Scale Process Plant Models Using Random Walk on Graphs.

Weiwei Mao, Zhuheng Lu, Yuewei Dai, Weiqing Li, Zhiyong Su

IEEE Access, 2020

2019

SmartWAZ: Design and Implementation of a Smart WiFi Access System Assisted by Zigbee.

Bo Zhang, Jinhang Zuo, Weiwei Mao

IEEE Access, 2019

2013

Quantized-data consensus of second-order multi-agent systems with directed topology.

Chao Wang, Weiwei Mao, Xiaobo Li, Weisheng Chen, Jing Li

Proceedings of the 9th Asian Control Conference, 2013

1996

Improving Gate Level Fault Coverage by RTL Fault Grading.

Weiwei Mao, Ravi K. Gulati

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1994

Reducing correlation to improve coverage of delay faults in scan-path design.

Weiwei Mao, Michael D. Ciletti

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994

Structure and Metrology for a Single-wire Analog.

Yunsheng Lu, Weiwei Mao, Ramaswami Dandapani, Ravi K. Gulati

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1992

IDDQ testing: A review.

Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao

J. Electron. Test., 1992

Quietest: A methodology for selecting IDDQ test vectors.

Weiwei Mao, Ravi K. Gulati

J. Electron. Test., 1992

Robustness Enhancement and Detection Threshold Reduction in ATPG for Gate Delay Faults.

Weiwei Mao, Michael D. Ciletti

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

Detection of "Undetectable" Faults Using I_DDQ Testing.

Ravi K. Gulati, Weiwei Mao, Deepak K. Goel

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

A quantitative measure of robustness for delay fault testing.

Weiwei Mao, Michael D. Ciletti

Proceedings of the conference on European design automation, 1992

1991

Correlation-Reduced Scan-path Design To Improve Delay Fault Coverage.

Weiwei Mao, Michael D. Ciletti

Proceedings of the 28th Design Automation Conference, 1991

1990

Arrangement of latches in scan-path design to improve delay fault coverage.

Weiwei Mao, Michael D. Ciletti

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

QUIETEST: A Quiescent Current Testing Methodology for Detecting Leakage Faults.

Weiwei Mao, Ravi K. Gulati, Deepak K. Goel, Michael D. Ciletti

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 1990

A Variable Observation Time Method for Testing Delay Faults.

Weiwei Mao, Michael D. Ciletti

Proceedings of the 27th ACM/IEEE Design Automation Conference. Orlando, 1990

1989

A Simplified Six-waveform Type Method for Delay Fault Testing.

Weiwei Mao, Michael D. Ciletti

Proceedings of the 26th ACM/IEEE Design Automation Conference, 1989

1988

Dytest: A Self-Learning Algorithm Using Dynamic Testability Measures to Accelerate Test Generation.

Weiwei Mao, Michael D. Ciletti

Proceedings of the 25th ACM/IEEE Conference on Design Automation, 1988

1986

Robust test generation algorithm for stuck-open fault in CMOS circuits.

Weiwei Mao, Xieting Ling

Proceedings of the 23rd ACM/IEEE Design Automation Conference. Las Vegas, 1986