S. Ooshiro

According to our database1, S. Ooshiro authored at least 2 papers in 2001.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2001
Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability.
Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, 2001

Correlation method of circuit-performance and technology fluctuations for improved design reliability.
Proceedings of ASP-DAC 2001, 2001


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