Samy Makar

According to our database, Samy Makar authored at least 12 papers between 1988 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

Self-repair of uncore components in robust system-on-chips: An OpenSPARC T2 case study.

Yanjing Li, Eric Cheng, Samy Makar, Subhasish Mitra

Proceedings of the 2013 IEEE International Test Conference, 2013

2008

CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns.

Yanjing Li, Samy Makar, Subhasish Mitra

Proceedings of the Design, Automation and Test in Europe, 2008

2007

Testing of Vega2, a chip multi-processor with spare processors.

Samy Makar, Tony Altinis, Niteen Patkar, Janet Wu

Proceedings of the 2007 IEEE International Test Conference, 2007

2002

Design for Testability and Testing of IEEE 1149.1 Tap Controller.

Subhasish Mitra, Edward J. McCluskey, Samy Makar

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

1998

A layout-based approach for ordering scan chain flip-flops.

Samy Makar

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

ATPG for scan chain latches and flip-flops.

Samy Makar, Edward J. McCluskey

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

1995

Floating Point Fault Tolerance with Backward Error Assertions.

Daniel Boley, Gene H. Golub, Samy Makar, Nirmal R. Saxena, Edward J. McCluskey

IEEE Trans. Computers, 1995

Checking experiments to test latches.

Samy Makar, Edward J. McCluskey

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Functional Tests for Scan Chain Latches.

Samy Makar, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1989

The critical path for multiple faults.

Samy Makar, Edward J. McCluskey

Proceedings of the 1989 IEEE International Conference on Computer-Aided Design, 1989

1988

Probability models for pseudorandom test sequences.

Edward J. McCluskey, Samy Makar, Samiha Mourad, Kenneth D. Wagner

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988

On the Testing of Multiplexers.

Samy Makar, Edward J. McCluskey

Proceedings of the Proceedings International Test Conference 1988, 1988