Kenneth D. Wagner

According to our database, Kenneth D. Wagner authored at least 13 papers between 1985 and 2005.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2005

Keeping current with silicon and systems technology in the mid-90s.

Kenneth D. Wagner

IEEE Des. Test Comput., 2005

1999

Robust Scan-Based Logic Test in VDSM Technologies.

Kenneth D. Wagner

Computer, 1999

1998

Design for Testability Techniques at the Behavioral and Register-Transfer Levels.

Sujit Dey, Anand Raghunathan, Kenneth D. Wagner

J. Electron. Test., 1998

1996

EIC Message.

Kenneth D. Wagner, Yervant Zorian

IEEE Des. Test Comput., 1996

High-Level Synthesis for Testability: A Survey and Perspective.

Kenneth D. Wagner, Sujit Dey

Proceedings of the 33st Conference on Design Automation, 1996

1993

Testable Programmable Digital Clock Pulse Control Elements.

Kenneth D. Wagner, Bernd Könemann

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1991

Enhancing Board Functional Self-Test by Concurrent Sampling.

Kenneth D. Wagner, Thomas W. Williams

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Guest Editorial: The Many Faces of Test.

Kenneth D. Wagner

IEEE Des. Test Comput., 1990

1988

Probability models for pseudorandom test sequences.

Edward J. McCluskey, Samy Makar, Samiha Mourad, Kenneth D. Wagner

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988

Clock system design.

Kenneth D. Wagner

IEEE Des. Test, 1988

Design for Testability of Mixed Signal Integrated Circuits.

Kenneth D. Wagner, Thomas W. Williams

Proceedings of the Proceedings International Test Conference 1988, 1988

1987

Pseudorandom Testing.

Kenneth D. Wagner, Cary K. Chin, Edward J. McCluskey

IEEE Trans. Computers, 1987

1985

The Error Latency of Delay Faults in Combinational and Sequential Circuits.

Kenneth D. Wagner

Proceedings of the Proceedings International Test Conference 1985, 1985