Sebastián Matías Pazos

Orcid: 0000-0002-7354-4530

According to our database1, Sebastián Matías Pazos authored at least 6 papers between 2018 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2021
Line Resistance Impact in Memristor-based Multi Layer Perceptron for Pattern Recognition.
Proceedings of the 12th IEEE Latin America Symposium on Circuits and System, 2021

2020
Application of the Quasi-Static Memdiode Model in Cross-Point Arrays for Large Dataset Pattern Recognition.
IEEE Access, 2020

2019
Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
Performance-reliability trade-offs in short range RF power amplifier design.
Microelectron. Reliab., 2018

Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp.
Proceedings of the 31st Symposium on Integrated Circuits and Systems Design, 2018

Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks.
Proceedings of the IEEE International Reliability Physics Symposium, 2018


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