Nagarajan Raghavan

According to our database1, Nagarajan Raghavan authored at least 46 papers between 2007 and 2021.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2021
Developmental Trajectories in Blockchain Technology Using Patent-Based Knowledge Network Analysis.
IEEE Access, 2021

A Gaussian Mixture Model Clustering Ensemble Regressor for Semiconductor Manufacturing Final Test Yield Prediction.
IEEE Access, 2021

2020
Lubricating Oil Remaining Useful Life Prediction Using Multi-Output Gaussian Process Regression.
IEEE Access, 2020

Learning Localized Spatial Material Properties of Substrates in Ultra-Thin Packages Using Markov Chain Monte Carlo and Finite Element Analysis.
IEEE Access, 2020

Piecewise Model-Based Online Prognosis of Lithium-Ion Batteries Using Particle Filters.
IEEE Access, 2020

A Novel Framework for Semiconductor Manufacturing Final Test Yield Classification Using Machine Learning Techniques.
IEEE Access, 2020

Data Driven Prognosis of Fracture Dynamics Using Tensor Train and Gaussian Process Regression.
IEEE Access, 2020

Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

Correct Extrapolation Model for TDDB of STT-MRAM MgO Magnetic Tunnel Junctions.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
Comparison of experimental, analytical and simulation methods to estimate substrate material properties for warpage reliability analysis.
Microelectron. Reliab., 2018

A holistic comparison of the different resampling algorithms for particle filter based prognosis using lithium ion batteries as a case study.
Microelectron. Reliab., 2018

Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress.
Microelectron. Reliab., 2018

Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures.
Microelectron. Reliab., 2018

Heuristic Kalman optimized particle filter for remaining useful life prediction of lithium-ion battery.
Microelectron. Reliab., 2018

Application of multi-output Gaussian process regression for remaining useful life prediction of light emitting diodes.
Microelectron. Reliab., 2018

Application of expectation maximization and Kalman smoothing for prognosis of lumen maintenance life for light emitting diodes.
Microelectron. Reliab., 2018

Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Area and pulsewidth dependence of bipolar TDDB in MgO magnetic tunnel junction.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017
Uncertainty quantification in nanowire growth modeling - A precursor to quality semiconductor nanomanufacturing.
Microelectron. Reliab., 2017

Application of multiplicative dimensional reduction method for uncertainty quantification and sensitivity analysis of MEMS electrostatic actuators.
Microelectron. Reliab., 2017

A metaheuristic approach to remaining useful life estimation of systems subject to multiple degradation mechanisms.
Proceedings of the 2017 IEEE International Conference on Prognostics and Health Management, 2017

Uncertainty quantification in prognostics: A data driven polynomial chaos approach.
Proceedings of the 2017 IEEE International Conference on Prognostics and Health Management, 2017

2016
Conductive filament formation at grain boundary locations in polycrystalline HfO<sub>2</sub> -based MIM stacks: Computational and physical insight.
Microelectron. Reliab., 2016

Analysis of quantum conductance, read disturb and switching statistics in HfO<sub>2</sub> RRAM using conductive AFM.
Microelectron. Reliab., 2016

Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices.
Microelectron. Reliab., 2016

Compliance current dominates evolution of NiSi<sub>2</sub> defect size in Ni/dielectric/Si RRAM devices.
Microelectron. Reliab., 2016

2015
An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO<sub>2</sub>/SiO<sub>x</sub> dielectric stacks for failure analysis.
Microelectron. Reliab., 2015

Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach.
Microelectron. Reliab., 2015

Particle filter approach to lifetime prediction for microelectronic devices and systems with multiple failure mechanisms.
Microelectron. Reliab., 2015

Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory.
Microelectron. Reliab., 2015

Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Spectroscopy of SILC trap locations and spatial correlation study of percolation path in the high-κ and interfacial layer.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Remaining useful life estimation for systems subject to multiple degradation mechanisms.
Proceedings of the 2015 IEEE Conference on Prognostics and Health Management, 2015

2014
Impact of local structural and electrical properties of grain boundaries in polycrystalline HfO<sub>2</sub> on reliability of SiO<sub>x</sub> interfacial layer.
Microelectron. Reliab., 2014

High-κ dielectric breakdown in nanoscale logic devices - Scientific insight and technology impact.
Microelectron. Reliab., 2014

Prognostic methodology for remaining useful life estimation of retention loss in nanoscale resistive switching memory.
Microelectron. Reliab., 2014

Assessment of read disturb immunity in conducting bridge memory devices - A thermodynamic perspective.
Microelectron. Reliab., 2014

Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices.
Microelectron. Reliab., 2014

Performance and reliability trade-offs for high-κ RRAM.
Microelectron. Reliab., 2014

2009
Reply to comments on "A framework to practical predictive maintenance modeling for multi-state systems".
Reliab. Eng. Syst. Saf., 2009

2008
A framework to practical predictive maintenance modeling for multi-state systems.
Reliab. Eng. Syst. Saf., 2008

2007
An approach to statistical analysis of gate oxide breakdown mechanisms.
Microelectron. Reliab., 2007


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