Shalabh Goyal

According to our database, Shalabh Goyal authored at least 10 papers between 2004 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2009

Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation.

Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin

Proceedings of the 14th IEEE European Test Symposium, 2009

Low Cost Dynamic Test Methodology for High Precision ΣD ADCs.

Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

Linearity Testing of A/D Converters Using Selective Code Measurement.

Shalabh Goyal, Abhijit Chatterjee

J. Electron. Test., 2008

2007

A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters.

Shalabh Goyal, Abhijit Chatterjee, Michael Purtell

J. Electron. Test., 2007

2006

Low Cost Parametric Failure Diagnosis of RF Transceivers.

Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 11th European Test Symposium, 2006

Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test.

Shalabh Goyal, Abhijit Chatterjee, Mike Atia

Proceedings of the 11th European Test Symposium, 2006

Enhanced A/D Converter Signal-to-Noise-Ratio Testing in the Presence of Sampling Clock Jitter.

Shalabh Goyal, Abhijit Chatterjee, Yanan Shieh

Proceedings of the 15th Asian Test Symposium, 2006

2005

Test time reduction of successive approximation register A/D converter by selective code measurement.

Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester.

Shalabh Goyal, Michael Purtell

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2004

Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits.

Ganesh Srinivasan, Shalabh Goyal, Abhijit Chatterjee

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004