Vishwanath Natarajan

According to our database1, Vishwanath Natarajan authored at least 26 papers between 2006 and 2017.

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Bibliography

2017
A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources.
ACM Trans. Design Autom. Electr. Syst., 2017

2015
Yield Recovery of RF Transceiver Systems Using Iterative Tuning-Driven Power-Conscious Performance Optimization.
IEEE Des. Test, 2015

2014
Process-Variation Tolerant Channel-Adaptive Virtually Zero-Margin Low-Power Wireless Receiver Systems.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Built-in self-test and characterization of polar transmitter parameters in the loop-back mode.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2012
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting.
J. Electron. Test., 2012

2011
Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation.
Proceedings of the VLSI Design 2011: 24th International Conference on VLSI Design, 2011

Low-Power Adaptive Mixed Signal/RF Circuits and Systems and Self-Healing Solutions.
Proceedings of the Low-Power Variation-Tolerant Design in Nanometer Silicon, 2011

2010
Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems.
IEEE Des. Test Comput., 2010

A holistic approach to accurate tuning of RF systems for large and small multiparameter perturbations.
Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Built-in performance monitoring of mixed-signal/RF front ends using real-time parameter estimation.
Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures.
Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009
Iterative built-in testing and tuning of mixed-signal/RF systems.
Proceedings of the 27th International Conference on Computer Design, 2009

Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation.
Proceedings of the 14th IEEE European Test Symposium, 2009

BIST Driven Power Conscious Post-Manufacture Tuning of Wireless Transceiver Systems Using Hardware-Iterated Gradient Search.
Proceedings of the Eighteentgh Asian Test Symposium, 2009

Low Cost Dynamic Test Methodology for High Precision ΣD ADCs.
Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008
Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems.
VLSI Design, 2008

ACT: Adaptive Calibration Test for Performance Enhancement and Increased Testability of Wireless RF Front-Ends.
Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms.
Proceedings of the 2008 IEEE International Test Conference, 2008

Pro-VIZOR: process tunable virtually zero margin low power adaptive RF for wireless systems.
Proceedings of the 45th Design Automation Conference, 2008

Efficient Low-Cost Testing of Wireless OFDM Polar Transceiver Systems.
Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007
Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources.
Proceedings of the 16th Asian Test Symposium, 2007

2006
Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms.
Proceedings of the 19th International Conference on VLSI Design (VLSI Design 2006), 2006

On-Line Error Detection in Wireless RF Transmitters Using Real-time Streaming Data.
Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006


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