Hosam Haggag

According to our database, Hosam Haggag authored at least 10 papers between 1999 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2008

Testing of Precision DAC Using Low-Resolution ADC With Wobbling.

Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen

IEEE Trans. Instrum. Meas., 2008

2006

Decision Tree Based Mismatch Diagnosis in Analog Circuits.

Mingjing Chen, Hosam Haggag, Alex Orailoglu

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Testing of Precision DACs Using Low-Resolution ADCs with Dithering.

Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement.

Karen Taylor, Bryan Nelson, Alan Chong, Henry C. Lin, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz

IEEE Trans. Instrum. Meas., 2005

Panel synopsis: reducing high-speed/RF test cost: guaranteed by design or guaranteed to fail?

Hosam Haggag, Abhijit Chatterjee

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Test time reduction of successive approximation register A/D converter by selective code measurement.

Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Experimental Results for High-Speed Jitter Measurement Technique.

Karen Taylor, Bryan Nelson, Alan Chong, Hieu Nguyen, Henry C. Lin, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

CMOS Built-In Test Architecture for High-Speed Jitter Measurement.

Henry C. Lin, Karen Taylor, Alan Chong, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Automated test development and test time reduction for RF subsystems.

Sule Ozev, Alex Orailoglu, Hosam Haggag

Proceedings of the 2002 International Symposium on Circuits and Systems, 2002

1999

Closing The Gap Between Process Development and Mixed Signal Design and Testing.

Hosam Haggag

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999