Shigeki Nishikawa

According to our database, Shigeki Nishikawa authored at least 5 papers between 2000 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2005

Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees.

Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita

J. Electron. Test., 2005

2004

On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure.

Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita

Proceedings of the 2nd IEEE International Workshop on Electronic Design, 2004

2003

Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs.

Hideyuki Ichihara, Kozo Kinoshita, Koji Isodono, Shigeki Nishikawa

Proceedings of the 16th International Conference on VLSI Design (VLSI Design 2003), 2003

Reducing Scan Shifts Using Folding Scan Trees.

Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

2000

A high-speed IDDQ sensor implementation.

Yann Antonioli, Tsuneo Inufushi, Shigeki Nishikawa, Kozo Kinoshita

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000