Toshimasa Kuchii

According to our database, Toshimasa Kuchii authored at least 6 papers between 1996 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2007

A statistical error model for image sensors and its testing.

Hideyuki Ichihara, Toshimasa Kuchii, Masaaki Yamadate, Hideaki Sakaguchi, Hiroshi Uemura, Kozo Kinoshita

Syst. Comput. Jpn., 2007

2005

Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees.

Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita

J. Electron. Test., 2005

2004

On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure.

Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita

Proceedings of the 2nd IEEE International Workshop on Electronic Design, 2004

2003

Reducing Scan Shifts Using Folding Scan Trees.

Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

1997

Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates.

Masaki Hashizume, Toshimasa Kuchii, Takeomi Tamesada

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1996

Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits.

Toshimasa Kuchii, Masaki Hashizume, Takeomi Tamesada

Proceedings of the 5th Asian Test Symposium (ATS '96), 1996