Shogo Itai
Timeline
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Bibliography
2015
Comprehensive 2D-carrier profiling of low-doping region by high-sensitivity scanning spreading resistance microscopy (SSRM) for power device applications.
Microelectron. Reliab., 2015
7.5 A 3.3ns-access-time 71.2μW/MHz 1Mb embedded STT-MRAM using physically eliminated read-disturb scheme and normally-off memory architecture.
Proceedings of the 2015 IEEE International Solid-State Circuits Conference, 2015