Shosuke Fujii

According to our database, Shosuke Fujii authored at least 6 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Novel Operation Scheme for Suppressing Disturb in HfO2-based FeFET Considering Charge- Trapping-Coupled Polarization Dynamics.

Takamasa Hamai, Kunifumi Suzuki, Reika Ichihara, Yusuke Higashi, Yoko Yoshimura, Kiwamu Sakuma, Kensuke Ota, Kota Takahashi, Kazuhiro Matsuo, Shosuke Fujii, Masumi Saitoh

Proceedings of the IEEE International Reliability Physics Symposium, 2023

One-Pulse-Programmable Multi-Level PCM/Selector Cross-Point Memory for 20 nm Half Pitch and Beyond.

Yuya Matsuzawa, Yuki Ohnishi, Kazuhiro Katono, Yusuke Muto, Takayuki Tsukagoshi, Hiroki Tokuhira, Kei Sakamoto, Hisakazu Matsumori, Hiroyuki Ode, Shosuke Fujii, Hide Tanaka, Takeshi Fujimaki

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2020

Breakdown Lifetime Analysis of HfO2-based Ferroelectric Tunnel Junction (FTJ) Memory for In-Memory Reinforcement Learning.

Marina Yamaguchi, Shosuke Fujii, Kensuke Ota, Masumi Saitoh

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Ag Ionic Memory Cell Technology for Terabit-Scale High-DensityApplication.

Shosuke Fujii, Reika Ichihara, Takuya Konno, Marina Yamaguchi, Harumi Seki, Hiroki Tanaka, Dandan Zhao, Yoko Yoshimura, Masumi Saitoh, Masato Koyama

Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019

2018

Impact of specific failure mechanisms on endurance improvement for HfO2-based ferroelectric tunnel junction memory.

Marina Yamaguchi, Shosuke Fujii, Yuuichi Kamimuta, Shoichi Kabuyanagi, Tsunehiro Ino, Yasushi Nakasaki, Riichiro Takaishi, Reika Ichihara, Masumi Saitoh

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Emerging Non-Volatile Memory and Thin-Film Transistor Technologies for Future 3D-LSI.

Masumi Saitoh, Shosuke Fujii, Minoru Oda, Marina Yamaguchi, Shoichi Kabuyanagi, Yoko Yoshimura, Kensuke Ota, Kiwamu Sakuma, Yuuichi Kamimuta

Proceedings of the 48th European Solid-State Device Research Conference, 2018